Povej prijatelju o tem izdelku:
Point Defects in Semiconductors II: Experimental Aspects - Springer Series in Solid-State Sciences J. Bourgoin Softcover reprint of the original 1st ed. 1983 edition
Point Defects in Semiconductors II: Experimental Aspects - Springer Series in Solid-State Sciences
J. Bourgoin
In introductory solid-state physics texts we are introduced to the concept of a perfect crystalline solid with every atom in its proper place.
295 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 8. decembra 2011 |
| ISBN13 | 9783642818349 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 295 |
| Dimenzije | 155 × 235 × 17 mm · 449 g |
| Jezik | Angleščina |