Povej prijatelju o tem izdelku:
High Performance Gan Light-emitting Diode: a Reliability Study Zonglin Li
Do you have a profile? Prijava
Prejemajte obvestila o novih izdajah izvajalca Zonglin Li
Kaj pravijo naše stranke:
Dodaj na svoj seznam želja iMusic
High Performance Gan Light-emitting Diode: a Reliability Study
Zonglin Li
The reliability of InGaN/GaN light emitting diodes (LEDs) with different emission wavelengths and different geometries was studied. Device performances, like current-voltage characteristics, 1/f noise spectrum, leakage, static resistance, were measured. The devices underwent a 1000-hr constant-current stress test and their optical output degradation rate was examined. The results were explained by cross-related data.
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 17. maja 2011 |
| ISBN13 | 9783844395297 |
| Založniki | LAP LAMBERT Academic Publishing |
| Strani | 80 |
| Dimenzije | 150 × 5 × 226 mm · 137 g |
| Jezik | Nemščina |
Ogled vseh Zonglin Li ( Na primer Paperback Book )