Povej prijatelju o tem izdelku:
From scientific instrument to industrial machine: Coping with architectural stress in embedded systems - SpringerBriefs in Electrical and Computer Engineering Sjir Van Loo 2012 edition
From scientific instrument to industrial machine: Coping with architectural stress in embedded systems - SpringerBriefs in Electrical and Computer Engineering
Sjir Van Loo
Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In this book, the authors look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company.
90 pages, 55 black & white illustrations, 1 black & white tables, 1 colour tables, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 29. aprila 2012 |
| ISBN13 | 9789400741461 |
| Založniki | Springer |
| Žanr | Aspects (Academic) > Science / Technology Aspects |
| Strani | 112 |
| Dimenzije | 155 × 235 × 6 mm · 185 g |
| Urednik | Doornbos, Richard |
| Urednik | Van Loo, Sjir |
Božična darila lahko vrnete do 31. januarja