Povej prijatelju o tem izdelku:
Defects and Properties of Semiconductors: Defect Engineering - Advances in Solid State Technology J Chikawa Softcover reprint of the original 1st ed. 1987 edition
Defects and Properties of Semiconductors: Defect Engineering - Advances in Solid State Technology
J Chikawa
Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication.
272 pages, black & white illustrations
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 25. decembra 2011 |
| ISBN13 | 9789401086165 |
| Založniki | Springer |
| Strani | 300 |
| Dimenzije | 152 × 229 × 14 mm · 367 g |
| Urednik | Chikawa, J. |
| Urednik | Sumino, K. |
| Urednik | Wada, K. |