CMOS RF Circuit Design for Reliability and Variability - SpringerBriefs in Reliability - Jiann-Shiun Yuan - Books - Springer Verlag, Singapore - 9789811008825 - April 21, 2016
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CMOS RF Circuit Design for Reliability and Variability - SpringerBriefs in Reliability 1st ed. 2016 edition

Jiann-Shiun Yuan

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CMOS RF Circuit Design for Reliability and Variability - SpringerBriefs in Reliability 1st ed. 2016 edition

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.

106 pages, 101 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 21, 2016
ISBN13 9789811008825
Publishers Springer Verlag, Singapore
Pages 106
Dimensions 155 × 235 × 6 mm   ·   1.83 kg
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