VLSI Design and Test - - Books - Springer Verlag, Singapore - 9789811074691 - December 22, 2017
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VLSI Design and Test 1st ed. 2017 edition

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VLSI Design and Test 1st ed. 2017 edition

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.

815 pages, 486 Illustrations, black and white; XXI, 815 p. 486 illus.

Media Books     Book
Released December 22, 2017
ISBN13 9789811074691
Publishers Springer Verlag, Singapore
Pages 815
Dimensions 1.25 kg
Editor Dasgupta, Sudeb
Editor Kaushik, Brajesh Kumar
Editor Singh, Virendra