Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices - Selected Topics in Electronics and Systems - Daniel M. Fleetwood - Knjige - World Scientific Publishing Co Pte Ltd - 9789812389404 - 3. avgusta 2004
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Daniel M. Fleetwood
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices - Selected Topics in Electronics and Systems

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

348 pages, Illustrations

Medij Knjige     Hardcover Book   (Knjiga s trdim hrbtom in platnicami)
Izdano 3. avgusta 2004
ISBN13 9789812389404
Založniki World Scientific Publishing Co Pte Ltd
Strani 348
Dimenzije 161 × 235 × 25 mm   ·   650 g
Jezik Angleščina  
Urednik Fleetwood, D M (Vanderbilt University, USA)
Urednik Schrimpf, R D (Vanderbilt University, USA)

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