Electromigration Modeling at Circuit Layout Level - SpringerBriefs in Applied Sciences and Technology - Cher Ming Tan - Knjige - Springer Verlag, Singapore - 9789814451208 - 4. maja 2013
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Electromigration Modeling at Circuit Layout Level - SpringerBriefs in Applied Sciences and Technology 2013 edition

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Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.


120 pages, 73 black & white illustrations, 2 colour illustrations, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 4. maja 2013
ISBN13 9789814451208
Založniki Springer Verlag, Singapore
Strani 103
Dimenzije 155 × 235 × 6 mm   ·   1,88 kg

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