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X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction.
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 12. avgusta 2025 |
| ISBN13 | 9789819659449 |
| Založniki | Springer Nature Switzerland AG |
| Strani | 186 |
| Dimenzije | 150 × 220 × 20 mm · 453 g |
| Urednik | Evans, Paul G. |
| Urednik | Sando, Daniel |
| Urednik | Valanoor, Nagarajan |