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Atomic Force Microscopy / Scanning Tunneling Microscopy 2 Samuel H Cohen 1997 edition
Atomic Force Microscopy / Scanning Tunneling Microscopy 2
Samuel H Cohen
Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
250 pages, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 30. aprila 1997 |
| ISBN13 | 9780306455964 |
| Založniki | Springer Science+Business Media |
| Strani | 250 |
| Dimenzije | 178 × 254 × 16 mm · 680 g |
| Urednik | Cohen, Samuel H. |
| Urednik | Lightbody, Marcia L. |