Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization - A W Czanderna - Knjige - Springer Science+Business Media - 9780306458965 - 31. oktobra 1998
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A W Czanderna
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization 2002 edition

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The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

430 pages, biography

Medij Knjige     Hardcover Book   (Knjiga s trdim hrbtom in platnicami)
Izdano 31. oktobra 1998
ISBN13 9780306458965
Založniki Springer Science+Business Media
Strani 430
Dimenzije 156 × 234 × 25 mm   ·   811 g
Urednik Czanderna, Alvin W.
Urednik Madey, Theodore E.
Urednik Powell, Cedric J.

Več od istega **izdajatelja**

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