Povej prijatelju o tem izdelku:
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics Ullrich Pietsch 2nd ed. 2004 edition
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics
Ullrich Pietsch
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.
428 pages, 389 black & white illustrations, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 27. avgusta 2004 |
| ISBN13 | 9780387400921 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 408 |
| Dimenzije | 155 × 235 × 23 mm · 816 g |
| Jezik | Angleščina |