Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing Manoj Sachdev 2nd ed. 2007 edition

Name: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing
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Author: Manoj Sachdev

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Paperback Book

Softcover reprint of hardcover 2nd ed. 2007 edition

(2010) € 214,99

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing

Manoj Sachdev

2nd ed. 2007 edition

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

328 pages, biography

Medij	Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami)
Izdano	21. junija 2007
ISBN13	9780387465463
Založniki	Springer-Verlag New York Inc.
Strani	328
Dimenzije	155 × 235 × 20 mm · 721 g
Jezik	Angleščina