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Electromigration and Electronic Device Degradation A Christou
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Electromigration and Electronic Device Degradation
A Christou
This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details.
344 pages
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 15. decembra 1993 |
| Prvotni datum izida | 1994 |
| ISBN13 | 9780471584896 |
| Založniki | John Wiley & Sons Inc |
| Strani | 343 |
| Dimenzije | 160 × 240 × 20 mm · 684 g |
| Jezik | Angleščina |
| Urednik | Christou, Aris (CALCE Electronic Packaging Research Center, University of Maryland) |
