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Electrothermal Analysis of VLSI Systems 2002 edition
Yi-Kan Cheng
Electrothermal Analysis of VLSI Systems 2002 edition
Yi-Kan Cheng
This useful book addresses electrothermal problems in modern VLSI systems. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
210 pages, 36 black & white illustrations, biography
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | June 30, 2000 |
ISBN13 | 9780792378617 |
Publishers | Springer |
Pages | 210 |
Dimensions | 155 × 235 × 14 mm · 512 g |
Language | English |
See all of Yi-Kan Cheng ( e.g. Hardcover Book and Paperback Book )