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Speckle Metrology - Optical Science and Engineering
Sirohi
Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).
568 pages
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 20. maja 1993 |
| ISBN13 | 9780824789329 |
| Založniki | Taylor & Francis Inc |
| Strani | 572 |
| Dimenzije | 150 × 220 × 20 mm · 861 g |
| Jezik | Angleščina |
| Urednik serije | Thompson, Brian J. (University of Rochester, New York, USA) |
