Povej prijatelju o tem izdelku:
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings Martin Gall
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings
Martin Gall
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
204 pages, black & white illustrations
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 5. junija 2014 |
| ISBN13 | 9781107408319 |
| Založniki | Cambridge University Press |
| Strani | 204 |
| Dimenzije | 152 × 229 × 11 mm · 433 g (Teža (ocenjena)) |
| Jezik | Angleščina |
| Urednik | Gall, Martin |
| Urednik | Grill, Alfred (IBM T J Watson Research Center, New York) |
| Urednik | Koike, Junichi (Tohoku University, Japan) |
| Urednik | Lacopi, Francesca |
| Urednik | Usui, Takamasa |
Božična darila lahko vrnete do 31. januarja