Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing - Erik Larsson - Knjige - Springer-Verlag New York Inc. - 9781402032073 - 7. novembra 2005
Če se naslovnica in naslov ne ujemata, je naslov pravilen

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing 2005 edition

Cena
€ 143,49

Naročeno iz oddaljenega skladišča

Predvidena dobava 17. - 25. sep
Prejemajte obvestila o novih izdajah izvajalca Erik Larsson
Dodaj na svoj seznam želja iMusic

Not rated yet

Na voljo tudi kot:

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.


388 pages, biography

Medij Knjige     Hardcover Book   (Knjiga s trdim hrbtom in platnicami)
Izdano 7. novembra 2005
ISBN13 9781402032073
Založniki Springer-Verlag New York Inc.
Strani 388
Dimenzije 156 × 232 × 23 mm   ·   1,09 kg
Jezik Angleščina  

Več od istega **izdajatelja**