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Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing Erik Larsson 2005 edition
Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing
Erik Larsson
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.
388 pages, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 7. novembra 2005 |
| ISBN13 | 9781402032073 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 388 |
| Dimenzije | 156 × 232 × 23 mm · 1,09 kg |
| Jezik | Angleščina |