Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing - Erik Larsson - Knjige - Springer-Verlag New York Inc. - 9781441952691 - 2. februarja 2011
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Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2005 edition

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Na voljo tudi kot:

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.


388 pages, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 2. februarja 2011
Prvotni datum izida 2010
ISBN13 9781441952691
Založniki Springer-Verlag New York Inc.
Strani 388
Dimenzije 150 × 220 × 10 mm   ·   571 g
Jezik Angleščina  

Več od istega **izdajatelja**