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Image-Based Fractal Description of Microstructures J.M. Li 2003 edition
Image-Based Fractal Description of Microstructures
J.M. Li
Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
272 pages, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 31. julija 2003 |
| ISBN13 | 9781402075070 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 272 |
| Dimenzije | 155 × 235 × 17 mm · 616 g |
| Jezik | Angleščina |