Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing Manoj Sachdev Softcover reprint of hardcover 2nd ed. 2007 edition

Name: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing
Price: 189.99 EUR
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Author: Manoj Sachdev

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Hardcover Book

2nd ed. 2007 edition

(2007) € 189,99

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing

Manoj Sachdev

Softcover reprint of hardcover 2nd ed. 2007 edition

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

328 pages, black & white illustrations

Medij	Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano	10. novembra 2010
ISBN13	9781441942852
Založniki	Springer-Verlag New York Inc.
Strani	328
Dimenzije	155 × 235 × 18 mm · 494 g
Jezik	Angleščina