Povej prijatelju o tem izdelku:
Yield and Variability Optimization of Integrated Circuits Jian Cheng Zhang Softcover reprint of the original 1st ed. 1995 edition
Yield and Variability Optimization of Integrated Circuits
Jian Cheng Zhang
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.
234 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 2. novembra 2012 |
| Prvotni datum izida | 1995 |
| ISBN13 | 9781461359357 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 234 |
| Dimenzije | 155 × 235 × 13 mm · 362 g |
| Jezik | Angleščina |