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Helium Ion Microscopy: Principles and Applications - SpringerBriefs in Materials David C. Joy 2013 edition
Helium Ion Microscopy: Principles and Applications - SpringerBriefs in Materials
David C. Joy
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century.
72 pages, 13 black & white illustrations, 16 colour illustrations, 2 black & white tables, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 14. septembra 2013 |
| ISBN13 | 9781461486596 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 64 |
| Dimenzije | 155 × 235 × 8 mm · 158 g |
| Jezik | Angleščina |