Alberto Bosio
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Alberto Bosio 2010 edition

Name: Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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Author: Alberto Bosio

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Hardcover Book

2010 edition

(2009) € 111,49

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Alberto Bosio

2010 edition

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.

171 pages, 22 black & white tables, biography

Medij	Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano	3. septembra 2014
ISBN13	9781489983145
Založniki	Springer-Verlag New York Inc.
Strani	171
Dimenzije	155 × 235 × 10 mm · 272 g
Jezik	Angleščina