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Microelectronic Test Structures for Cmos Technology Manjul Bhushan
Microelectronic Test Structures for Cmos Technology
Manjul Bhushan
Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.
373 pages, 37 black & white tables, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 1. oktobra 2014 |
| ISBN13 | 9781489990556 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 373 |
| Dimenzije | 155 × 235 × 21 mm · 566 g |
| Jezik | Angleščina |
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