Povej prijatelju o tem izdelku:
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences Softcover Reprint of the Original 1st 2018 edition
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences
521 pages, 40 Tables, color; 194 Illustrations, color; 40 Illustrations, black and white; XXIV, 521
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 4. januarja 2019 |
| ISBN13 | 9783030092986 |
| Založniki | Springer Nature Switzerland AG |
| Strani | 521 |
| Dimenzije | 150 × 220 × 10 mm · 757 g |
| Jezik | Nemščina |
| Urednik | Glatzel, Thilo |
| Urednik | Sadewasser, Sascha |