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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences 2018 edition
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences
521 pages, 40 Tables, color; 194 Illustrations, color; 40 Illustrations, black and white; XXIV, 521
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 19. marca 2018 |
| ISBN13 | 9783319756868 |
| Založniki | Springer International Publishing AG |
| Strani | 521 |
| Dimenzije | 242 × 167 × 38 mm · 986 g |
| Jezik | Nemščina |
| Urednik | Glatzel, Thilo |
| Urednik | Sadewasser, Sascha |