Povej prijatelju o tem izdelku:
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization Sheldon Tan 2019 edition
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Sheldon Tan
460 pages, 195 Illustrations, color; 16 Illustrations, black and white; XLI, 460 p. 211 illus., 195
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 25. septembra 2020 |
| ISBN13 | 9783030261740 |
| Založniki | Springer Nature Switzerland AG |
| Strani | 460 |
| Dimenzije | 150 × 220 × 10 mm · 765 g |
| Jezik | Nemščina |