Povej prijatelju o tem izdelku:
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization Sheldon Tan 2019 edition
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Sheldon Tan
460 pages, 195 Illustrations, color; 16 Illustrations, black and white; XLI, 460 p. 211 illus., 195
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 25. septembra 2019 |
| ISBN13 | 9783030261719 |
| Založniki | Springer Nature Switzerland AG |
| Strani | 460 |
| Dimenzije | 150 × 220 × 20 mm · 916 g |
| Jezik | Nemščina |
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