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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies Antonio Manuel Lourenco Canelas 2020 edition
Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Antonio Manuel Lourenco Canelas
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.
237 pages, 87 Tables, color; 97 Illustrations, color; 42 Illustrations, black and white; XXIII, 237
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 21. marca 2021 |
| ISBN13 | 9783030415389 |
| Založniki | Springer Nature Switzerland AG |
| Strani | 237 |
| Dimenzije | 150 × 220 × 10 mm · 371 g |
| Jezik | Nemščina |
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