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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques Behnam Ghavami 2021 edition
Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
Behnam Ghavami
Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
114 pages, 50 Tables, color; 9 Illustrations, color; 30 Illustrations, black and white; XIII, 114 p.
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 14. oktobra 2021 |
| ISBN13 | 9783030516123 |
| Založniki | Springer Nature Switzerland AG |
| Strani | 114 |
| Dimenzije | 150 × 220 × 10 mm · 209 g |
| Jezik | Nemščina |
Več od istega **izdajatelja**
Ogled vseh Behnam Ghavami ( Na primer Hardcover Book in Paperback Book )