Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques - Behnam Ghavami - Knjige - Springer Nature Switzerland AG - 9783030516123 - 14. oktobra 2021
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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques 2021 edition

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Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.


114 pages, 50 Tables, color; 9 Illustrations, color; 30 Illustrations, black and white; XIII, 114 p.

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 14. oktobra 2021
ISBN13 9783030516123
Založniki Springer Nature Switzerland AG
Strani 114
Dimenzije 150 × 220 × 10 mm   ·   209 g
Jezik Nemščina  

Več od istega **izdajatelja**