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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Peter Pichler 2004 edition
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics
Peter Pichler
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.
554 pages, 40 black & white illustrations, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 2. junija 2004 |
| ISBN13 | 9783211206874 |
| Založniki | Springer Verlag GmbH |
| Strani | 554 |
| Dimenzije | 178 × 254 × 31 mm · 1,18 kg |
| Jezik | Angleščina Nemščina |
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