Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics - Peter Pichler - Knjige - Springer Verlag GmbH - 9783709172049 - 1. novembra 2012
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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Softcover reprint of the original 1st ed. 2004 edition

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This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.


554 pages, 40 black & white illustrations, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 1. novembra 2012
ISBN13 9783709172049
Založniki Springer Verlag GmbH
Strani 554
Dimenzije 178 × 254 × 30 mm   ·   1,01 kg
Jezik Angleščina  

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