Povej prijatelju o tem izdelku:
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Peter Pichler Softcover reprint of the original 1st ed. 2004 edition
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics
Peter Pichler
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.
554 pages, 40 black & white illustrations, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 1. novembra 2012 |
| ISBN13 | 9783709172049 |
| Založniki | Springer Verlag GmbH |
| Strani | 554 |
| Dimenzije | 178 × 254 × 30 mm · 1,01 kg |
| Jezik | Angleščina |
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Ogled vseh Peter Pichler ( Na primer Book , Paperback Book in Hardcover Book )