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Applied Scanning Probe Methods I - NanoScience and Technology 2004 edition
B Bhushan
Applied Scanning Probe Methods I - NanoScience and Technology 2004 edition
B Bhushan
This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.
476 pages, biography
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | January 13, 2004 |
ISBN13 | 9783540005278 |
Publishers | Springer-Verlag Berlin and Heidelberg Gm |
Pages | 476 |
Dimensions | 155 × 235 × 27 mm · 870 g |
Language | French |
Editor | Bhushan, Bharat |
Editor | Fuchs, Harald |
Editor | Hosaka, Sumio |
See all of B Bhushan ( e.g. Hardcover Book )