Applied Scanning Probe Methods I - NanoScience and Technology - B Bhushan - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540005278 - January 13, 2004
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Applied Scanning Probe Methods I - NanoScience and Technology 2004 edition

B Bhushan

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Applied Scanning Probe Methods I - NanoScience and Technology 2004 edition

This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.

476 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 13, 2004
ISBN13 9783540005278
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 476
Dimensions 155 × 235 × 27 mm   ·   870 g
Language French  
Editor Bhushan, Bharat
Editor Fuchs, Harald
Editor Hosaka, Sumio

See all of B Bhushan ( e.g. Hardcover Book )