Povej prijatelju o tem izdelku:
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics Mathias Schubert Softcover reprint of hardcover 1st ed. 2004 edition
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics
Mathias Schubert
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.
196 pages, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 23. novembra 2010 |
| ISBN13 | 9783642062285 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 196 |
| Dimenzije | 155 × 235 × 11 mm · 299 g |
| Jezik | Angleščina |