Povej prijatelju o tem izdelku:
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics Mathias Schubert 2004 edition
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics
Mathias Schubert
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.
196 pages, biography
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 26. novembra 2004 |
| ISBN13 | 9783540232490 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 196 |
| Dimenzije | 155 × 232 × 12 mm · 476 g |
| Jezik | Angleščina Nemščina |