Povej prijatelju o tem izdelku:
Applied Scanning Probe Methods XII: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2009 edition
Applied Scanning Probe Methods XII: Characterization - NanoScience and Technology
Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties.
279 pages, 14 black & white tables, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 22. novembra 2010 |
| ISBN13 | 9783642098703 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Strani | 224 |
| Dimenzije | 150 × 220 × 10 mm · 429 g |
| Jezik | Nemščina |
| Urednik | Bhushan, Bharat |
| Urednik | Fuchs, Harald |