Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics - Otwin Breitenstein - Knjige - Springer-Verlag Berlin and Heidelberg Gm - 9783642264788 - 6. novembra 2012
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Otwin Breitenstein
Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics Softcover reprint of hardcover 2nd ed. 2010 edition

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Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.

258 pages, 56 black & white illustrations, 33 colour illustrations, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 6. novembra 2012
ISBN13 9783642264788
Založniki Springer-Verlag Berlin and Heidelberg Gm
Strani 258
Dimenzije 155 × 235 × 18 mm   ·   385 g
Jezik Angleščina  

Več od istega **izdajatelja**

Ogled vseh Otwin Breitenstein