Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics - Hui Xie - Knjige - Springer-Verlag Berlin and Heidelberg Gm - 9783642445019 - 26. novembra 2014
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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics 2012 edition

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Na voljo tudi kot:

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.


344 pages, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 26. novembra 2014
ISBN13 9783642445019
Založniki Springer-Verlag Berlin and Heidelberg Gm
Strani 344
Dimenzije 155 × 235 × 19 mm   ·   503 g
Jezik Angleščina  

Več od istega **izdajatelja**

Ogled vseh Hui Xie ( Na primer Hardcover Book in Paperback Book )