Povej prijatelju o tem izdelku:
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Mohammad Tehranipoor 2008 edition
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing
Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.
424 pages, 1, black & white illustrations
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 10. decembra 2007 |
| ISBN13 | 9780387747460 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 408 |
| Dimenzije | 155 × 235 × 23 mm · 811 g |
| Jezik | Angleščina |
| Urednik | Tehranipoor, Mohammad |