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Advances in X-Ray Analysis: Volume 25 John C Russ Softcover reprint of the original 1st ed. 1982 edition
Advances in X-Ray Analysis: Volume 25
John C Russ
In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction.
398 pages, 104 black & white illustrations, biography
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 24. julija 2012 |
| ISBN13 | 9781461399957 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 398 |
| Dimenzije | 170 × 244 × 22 mm · 666 g |
| Jezik | Angleščina |
| Urednik | Russ, John C. |