Povej prijatelju o tem izdelku:
Surface and Interface Characterization by Electron Optical Methods - Nato ASI Subseries B: Ugo Valdre Softcover reprint of the original 1st ed. 1988 edition
Surface and Interface Characterization by Electron Optical Methods - Nato ASI Subseries B:
Ugo Valdre
The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.
319 pages, 156 black & white illustrations, 3 colour illustrations
| Medij | Knjige Paperback Book (Knjiga z mehkimi platnicami in lepljenim hrbtom) |
| Izdano | 25. novembra 2012 |
| Prvotni datum izida | 1989 |
| ISBN13 | 9781461595397 |
| Založniki | Springer-Verlag New York Inc. |
| Strani | 319 |
| Dimenzije | 170 × 244 × 17 mm · 530 g |
| Jezik | Angleščina |
| Urednik | Valdre, Ugo |