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Noncontact Atomic Force Microscopy: Volume 2 - NanoScience and Technology Seizo Morita 2009 edition
Noncontact Atomic Force Microscopy: Volume 2 - NanoScience and Technology
Seizo Morita
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution;
419 pages, 28 black & white illustrations, 77 colour illustrations, 7 black & white tables, biograph
| Medij | Knjige Hardcover Book (Knjiga s trdim hrbtom in platnicami) |
| Izdano | 1. oktobra 2009 |
| ISBN13 | 9783642014949 |
| Založniki | Springer-Verlag Berlin and Heidelberg Gm |
| Žanr | Aspects (Academic) > Science / Technology Aspects |
| Strani | 401 |
| Dimenzije | 155 × 235 × 25 mm · 703 g |
| Jezik | Francoščina |
| Urednik | Giessibl, Franz J. |
| Urednik | Morita, Seizo |
| Urednik | Wiesendanger, Roland |