Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO Science Series B - David Cherns - Knjige - Springer-Verlag New York Inc. - 9781461278504 - 13. oktobra 2011
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Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO Science Series B Softcover reprint of the original 1st ed. 1989 edition

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With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors.


412 pages, biography

Medij Knjige     Paperback Book   (Knjiga z mehkimi platnicami in lepljenim hrbtom)
Izdano 13. oktobra 2011
ISBN13 9781461278504
Založniki Springer-Verlag New York Inc.
Strani 412
Dimenzije 170 × 244 × 22 mm   ·   680 g
Jezik Angleščina  
Urednik Cherns, David

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